• Topics


    Topic 1: Plasma etching processes for advanced CMOS, memory & quantum technologies
    • FEOL and BEOL patterning for logic devices (Finfet, FDSOI, GAA, CFET, …)
    • Memory technologies (OXRAM, PCRAM, FeRAM, MRAM, …)
    • Quantum applications (patterning and etching of superconductors, ultralow damage etching of quantum materials …)
  • Topic 2: Plasma etching processes for more than Moore applications
    • MEMS, NEMS
    • Imagers
    • Photonics
    • Power electronics
    • LEDs
    • Solar cells...
  • Topic 3: Emerging plasma etching concept and technology
    • Plasma-enhanced and thermal ALE (atomic layer etching)
    • Isotropic etching (stacked nanosheet fabrication, MEMS/NEMS release, …)
    • Alternative patterning (block copolymer, TSD (topographic selective deposition) …)
    • Novel etch gas and chemistries
    • Cryo-etching
  • Topic 4: Plasma diagnostic, simulation and machine learning
    • New plasma sources
    • Plasma /reactor diagnostics
    • Process and surface chemistry modeling
    • Artificial intelligence/machine learning
  • Topic 5: Sustainable processes in micro & nanotechnology
    • Life cycle analysis of dry and wet etchings
    • Evaluation of new and low GWP gases
    • Process and chamber cleaning optimization, analysis of abatement step
  • Topic 6: Dry stripping and cleaning processes
    • Surface cleaning and decontamination
    • Study of dry-wet interactions
    • Charging, corrosion and collapse issues
  • Event PlanneR
    Registration
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    26 av Jean Kuntzmann - 38330 Montbonnot, France
    Tel : +33 825 595 525 (0,15€/min*)
    Information desk: Monday to Friday
    from 9:00 to 12:00 and 14:00 to 17:00
    Organization
    CEA-Leti
    17 avenue des martyrs, 38054 Grenoble Cedex, France
    Patricia Pimenta-Barros & Thierry Chevolleau
    pesm2026-organization@inviteo.fr
    (*) Prices starting from fixed line incumbent, a surcharge may be applied by operators, counting the second after the first 45 seconds.

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